徐子晖,孙莹,袁秀良,安世海

• 1:北京航空航天大学物理学院

摘要(Abstract)：

X射线衍射(XRD)分析是表征物质结构的基本手段,在材料、物理学、化学等相关学科的研究中不可或缺。相比于多晶,单晶在半导体、非线性光学、超导、拓扑绝缘体等前沿领域具有更重要的研究和应用价值,但是目前而言,大部分高校与研究机构所配备的X射线衍射仪都是通用型X射线衍射仪,在对单晶样品的测试中步骤较为复杂。本文使用Bruker D8 Advance型衍射仪对Si(001)单晶进行了X射线衍射实验,并对实验步骤与结果进行了阐述,为涉及X射线衍射实验的教学和科研工作提供参考。

关键词(KeyWords)： X射线衍射;单晶;摇摆曲线

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基金项目(Foundation):

作者(Author): 徐子晖,孙莹,袁秀良,安世海

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