教学型椭偏仪测量各向异性单轴晶体光学参数的方法研究A NOVEL METHOD TO MEASURE THE OPTICAL PARAMETERS OF ANISOTROPIC UNIAXIAL CRYSTALS WITH TEACHING ELLIPSOMETRY
张锁歆,钱建强,郝维昌,秦雨浩,姚星群
摘要(Abstract):
椭偏仪是一种常用的现代光学测量仪器,在物理实验教学中常用于测量各向同性材料的折射率、表面薄膜厚度等光学参数。本文提出一种利用教学型椭偏仪测量各向异性单轴晶体折射率等光学参数的方法。采用多入射角的方法增加系统自由度,建立数值反演模型,获得各向异性单轴晶体光学参数,并实验测量了钒酸钇晶体的折射率等光学参数。使用教学型椭偏仪测量各向异性单轴晶体光学参数,拓展了原有教学仪器的实验范围,有助于激发学生对实验的兴趣。
关键词(KeyWords): 椭偏仪;各向异性晶体;光学参数;折射率
基金项目(Foundation):
作者(Author): 张锁歆,钱建强,郝维昌,秦雨浩,姚星群
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