李莉,雷雨,滕保华,吴明和,杨宏春

• 1:电子科技大学物理学院

摘要(Abstract)：

本文基于能量守恒定律和傅里叶定律,建立了一种非常简单而直观的二维热传导物理模型。以工程上熔石英光学元件的氩离子束溅射为切入点,采用时域有限差分法数值计算了熔石英内部温度的二维演化规律,以及不同位置温度随时间的演化规律。计算结果表明,沿离子束入射方向熔石英温度演化规律呈现类高斯分布;离子束辐照区域内任一点的温度随时间的演化规律很大程度上依赖于入射离子束的脉冲形状。文中利用热学知识详细讨论了光学元件表面能量吸收对元件温度演化规律的影响。

关键词(KeyWords)： 热传导;离子束溅射;时域有限差分法;温度

Abstract:

Keywords:

基金项目(Foundation):

作者(Author): 李莉,雷雨,滕保华,吴明和,杨宏春

参考文献(References)：

• [1]唐永建,蒋伟阳.ICF低温冷冻靶制备技术进展[J].强激光与粒子束,1998,10(1):155-160.
• [2]GAO Xiang,FENG Guoying,HAN Jinghua.Investigation of laser induced damage by various initiators on the subsurface of fused silica[J].Optics Express,2012,20(20):22095-22101.
• [3]ZHU X P,LEI M K,DONG Z H,et al.Ablation of irradiated metals by high-intensity pulsed ion beam[M].Journal of the Korean Physical Society,2003,42:787-790.
• [4]QIAO B,ZEPT M,BORGHESI M,et al.Radiation-Pressure acceleration of ion beams from nanofoil targets:The leaky light-sail regime[J].Physical Review Letters,2010,105:55002.
• [5]LE X Y,ZHAO W J,YAN S,et al.Computer simulation of thermal-mechanical effects of high intensity pulsed ion beams on a metal surface[J].Surface and Coatings Technology,2000,128:381.
• [6]ISAKOVA Y I,PUSHKAREW A I,et al.Visualization and analysis of pulsed ion beam energy density profile with infrared imaging[J].Infrared Physics&Technology,2018,89:140-146.
• [7]WU Di,Mingkai LEI,Xiaopeng ZHU,et al.Numerical Study on the ablation effects of Tungsten irradiated by highintensity pulsed ion beam[J].Physics Procedia,2011,22:246-251.
• [8]ANDREA P,ANTONIO M.Laser-pulse sputtering of aluminum:Vaporization,boiling,superheating,and gas-dynamic effects[J].Phys.Rev.E.,1994,50:4716-4727.
• [9]孙承伟.激光辐照效应[M].北京:国防工业出版社,2002.
• [10]滕保华,廖旭.大学物理学[M].北京:科学出版社,2010.
• [11]曹列兆,周子航.热力学与统计物理[M].北京:科学出版社,2014.
• [12]Cai J X,Guo M,Jin G Y.Numerical simulation of thermal stress damage in 1064nm antireflection fused silica by millisecond pulsed laser.[J].Optik,2017,136:144-150.
• [13]GUIGNARD F,AUTRIC M,BAUDINAUD V.Temperature and residual stress evolution in CO2laser irradiated glass[J].SPIE,1998,3343:534-545.